Used HERMES MICROVISION / HMI eScan 400 #9263048 for sale

HERMES MICROVISION / HMI eScan 400 is a state-of-the-art scanning mask & wafer inspection system designed for automated inspection of semiconductor wafers and photomasks. HMI eScan 400 system consists of several major components: the microscopic imaging subsystem, the automated specimen stage, the pattern matching software, the wafer loader subsystem and multiple data storage subsystems. The microscopic imaging subsystem consists of a high-resolution charge-coupled device (CCD) camera and objective lenses. This subsystem captures accurate, high-resolution images of the wafers and masks with exceptional clarity and definition. The automated specimen stage is a computer-controlled XYZ stage that is used to accurately align the wafer or mask, and then moves it through the imaging area in a precise manner. This ensures accurate and repeatable imaging of the components. The pattern matching software is used to automatically compare the captured images to a digital model or reference design. It will then pinpoint any differences that may exist between the actual components and the model design. The wafer loader subsystem enables the imaging of multiple wafers in rapid succession, thus reducing the time required to scan a lot of components. Data storage subsystems permit the capture, storage and retrieval of imaging data. This data can then be used to document component changes or issues, enabling corrective action to be taken quickly and efficiently. In conclusion, HERMES MICROVISION eScan 400 is an advanced scanning mask & wafer inspection system that provides reliable and accurate imaging of wafers and photomasks. Its automated XYZ stage, pattern matching software, wafer loader and data storage subsystem provide the speed, accuracy and repeatability needed by semiconductor manufacturers for quality control purposes.