Used HERMES MICROVISION / HMI eScan 405 #9249422 for sale

HERMES MICROVISION / HMI eScan 405 is a state-of-the-art mask and wafer inspection equipment. The system is designed to detect defects and inconsistencies in wafer and mask products down to a 4-micron pitch. It provides automated wafer pre-alignment and scanning, white light imaging, automatic wafer recognition, and advanced data acquisition and manipulation capabilities. HMI eScan 405 makes use of an easy-to-use, menu-driven software with a user-friendly graphical interface that can be employed in a wide range of applications. The unit features high-resolution optics that allow for a precise scan across the full substrate area, and multi-spectral imaging that, when combined with advanced data acquisition technologies, provide for faster analysis times. HERMES MICROVISION eScan 405 also features a highly efficient partial-field-of-view (PFOV) imaging machine that allows for quick and efficient image capture. This tool effectively reduces images capture time by only scanning and capturing defects of interest. EScan 405 also includes advanced pattern recognition algorithms that enable correlated to parts such as solder balls, microbumps, and vias. This algorithm enables automatic defect classification and ensures efficient defect detection. In addition, the asset features automatic tool calibration which minimizes time spent on manual alignment of the tool. It is equipped with a specialized laser spot finder that automatically identifies the wafer edge and an automated defect recognition sub-model which performs all edge finding and inspection jobs automatically. Finally, HERMES MICROVISION / HMI eScan 405 includes an integrated defect review station which enables precise defect review and analysis with the use of a high-magnification stage. This station is outfitted with a high-resolution LED detector array which measures and treats defects separately, providing operators with detailed information about each issue. All together, HMI eScan 405 ensures top-notch quality in wafer and mask products by combining advanced optical and data acquisition technologies with automated wafer-handling and LED detection capabilities. Its user-centric design ensures that operators never waste time on tasks that are better left to the machine, enabling them to quickly and accurately identify and address any defects or inconsistencies in their products.