Used HERMES MICROVISION / HMI eScan 500 #9281328 for sale

HERMES MICROVISION / HMI eScan 500 is a mask & wafer inspection equipment used for evaluating the quality of semiconductor wafers and reticles. It offers a comprehensive, high resolution view of the wafer for detection, measurement, and classification of defects in the wafer structure. This advanced system uses a scanning electron microscope with a high-resolution digital camera to inspect the surfaces of both semiconductor wafers and masks. HMI eScan 500 unit is designed with an ergonomic platform, allowing for easy access to the integrated microscope, digital camera, and other components. The digital motorized X-Y stage that is part of the machine allows for precise sample alignment and navigation. The scan control software used for this machine is user-friendly and can be configured to determine the size and type of the wafer, mask, and reticle that is being inspected. HERMES MICROVISION eScan 500 also comes with an automated defect detection and classification tool, which can be used to detect and classify all types of randomly-distributed defects. This asset is designed with an ultraviolet Raman microspectroscopy and image analysis, which is used to pinpoint the location of the defects and to classify them according to size, shape, and type. This model also automatically acquires data from all features of the inspected specimen, eliminating manual input from the user. In addition to defect analysis, eScan 500 equipment is also capable of making measurements of the various features of the wafer, mask, and reticle. This includes measurements such as line width, edge profile, overlay, and resistivity. Moreover, the system is also capable of assessing the varying strain levels of the wafer or reticle. All of this data is stored in a database for later review and analysis, adding to the efficiency of the machine. Overall, HERMES MICROVISION / HMI eScan 500 is a powerful unit for inspecting semiconductor wafers and reticles. It provides a comprehensive view of the specimen, allowing users to investigate and analyze the various components that make up the wafer. The automated defect detection and classification machine adds efficiency to the machine, while the measuring capabilities provide an accurate analysis of the specimen. All in all, this tool is essential for making sure that the quality is up to par.