Used HIMS NMI-100 #9236870 for sale

HIMS NMI-100
Manufacturer
HIMS
Model
NMI-100
ID: 9236870
Defect inspection system.
HIMS NMI-100 is a technologically advanced mask & wafer inspection equipment. It has been designed to provide high resolution inspection capabilities on all types of semiconductor wafers. With its impressive performance, it is capable of quickly identifying defects and anomalies. NMI-100 features a robust optical system that provides highly accurate images for review and analysis. It uses advanced optics and lenses for high magnification and clarity. The optical unit includes a high resolution CCD camera and an automatic focusing machine. It also has a tri-color filter for detecting particles and for accurate measurement of wafer geometry. Additionally, it has an automated defect map feature to quickly identify and locate defects. HIMS NMI-100 includes a high speed software package for data collection, analysis, and reporting. It supports a variety of image formats for easy integration into other systems. The software also includes a defect recognition engine that can identify and classify various types of defects. The software provides detailed information about each defect and alert operators if needed. NMI-100 is also equipped with a powerful computer tool for real-time data collection and processing. It includes dedicated memory and processor for fast image processing and improved automation. The asset is also capable of controlling multiple robots for increased efficiency and accuracy. Furthermore, it can be set up to include a larger database of inspection images and recipes for consistent results. HIMS NMI-100 is both robust and simple to use. It is easy to setup and operate and requires minimal maintenance. With its advanced optical and computer systems, it can provide reliable results and keep up with rapid changes in technology. It is an excellent choice for mask and wafer inspection and offers a quick and efficient way to detect abnormalities.
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