Used HITACHI IS 1600 #9148323 for sale

HITACHI IS 1600 is an advanced mask and wafer inspection equipment. It enables users to achieve the highest possible performance levels in a single device. This system provides a wide variety of inspection capabilities that are optimized to serve the needs of the semiconductor industry. IS 1600 features a high-resolution vacuum scanning unit capable of inspecting 12 inch and 8 inch diameter masks and wafers. It has a high-precision camera that provides clear and accurate optical resolution images of 19μm. This camera ensures that any defect in the material is picked up without extra effort. HITACHI IS 1600 uses an automated defect detection algorithm that enables swift and accurate processing. This algorithm can detect and classify minute defects that range in size from 0.5μm to 100μm. It has an integrated error correction machine that is capable of recognizing and adjusting the data input patterns for any level of defect. The advanced optics of the tool guarantee high sensitivity, speed and accuracy of data extraction. IS 1600 also has a powerful auto-focus asset that ensures high-quality defect recognition. The model is integrated with various masking support tools such as the Scan and Dampening Maskion time sweep, which is designed to provide precise overlay accuracy and uniformity across the wafer. It has an advanced line trace tool that enables a 1000 x 1000 array overlay with accuracy, repeatability and reliability. HITACHI IS 1600 supports various output formats such as WMS format, FMD format and custom format for defect reports. These output formats provide a comprehensive picture of any defect encountered during the inspection. The equipment also has an integrated defect classification system that makes the analysis and classification of defects easier. The advanced user interface of the unit allows for efficient communication between the operator and the machine. The navigation menu is easy to use and provides quick access to all the features of the machine. IS 1600 is an advanced and powerful mask and wafer inspection tool that provides users with unmatched performance and reliability. It ensures high accuracy, repeatability and sensitivity for detecting minute defects on masks and wafers. The user-friendly interface of the asset allows for efficient operation and easy navigation.