Used HITACHI IS 2700 #9243641 for sale

HITACHI IS 2700 mask & wafer inspection equipment is a comprehensive solution for optoelectronic semiconductor device inspection. It features high speed parallel imaging with non-contact technology, which allows for the detection of defects under a microscope, in real-time. This system is most commonly used for the inspection of mask and wafer substrates, as well as substrates that have been coated with metal layers. The unit consists of a light source, a camera, and a control unit. The light source projects a light pattern onto the substrate, which then passes through an optical filter that selects the light wavelengths that the camera can detect. The camera records the image of the substrate and sends it to the control unit. The control unit then processes the image and compares it to the original design specifications, allowing for the detection of defects in the substrate material. IS 2700 machine utilizes a high-resolution CCD camera and a proprietary image-processing algorithm, which allows it to detect very small defects in the substrates. The tool can detect defects at the microlevel, including cracks, voids, and other types of deformities, which can cause failure in the devices. This asset also has a high sensitivity to dust particles, which can be damaging to the device. The model is equipped with an interactive user interface, which allows for easy operation and navigation. It features a series of menus and options, as well as an intuitive software that is easy to upload and analyze images. Additionally, the equipment is highly configurable, with an array of options, settings, and parameters for the inspections. In addition to the standard features, HITACHI IS 2700 inspection system also has a unique hardware component. This is a high-speed parallel imaging head, which consists of four laser diode sensors that generate pulses of light, illuminating a wide and uniform view of the substrate. This allows for detailed and accurate placement of the mosaic images and increases the inspection's accuracy and speed. IS 2700 is a powerful and reliable tool for optoelectronic semiconductor device inspection. It is capable of highly accurate and fast inspection of mask and wafer substrates. Its non-contact technology and high-speed parallel imaging head allow for it to be an essential tool for the detection of defects at the microlevel. Thanks to its interactive user interface and configurable options, HITACHI IS 2700 is an ideal solution for the efficient and precise inspection of optoelectronic semiconductor devices.