Used HITACHI IS 2700SE #9083778 for sale

HITACHI IS 2700SE is a world-leading equipment for mask and wafer inspection. It is designed to help semiconductor and microcircuit manufacturers measure, detect, and extract the relevant details from mask and wafer patterns for efficient process control and optimization. The system is composed of four main components: the light source, camera sub-unit, imaging machine, and the overlay analysis software. The light source is an ultra-violet (wavelength of around 365nm) discharge lamp with a power output of roughly 500W. The camera sub-tool is responsible for capturing and transferring the light source output to the imaging asset. The imaging model is comprised of two main components: the CCD camera and the binocular microscope. The microscope enables an enlargement of the image from the CCD camera to detect any defects and flaws quickly and accurately. The overlay analysis software then takes the captured image from the imaging equipment to determine the quality of the pattern on the wafer or mask, as well as to compare it to predefined standards. The system can support a variety of surface shapes and masks, with pixel sizes of up to 8um. It can handle layer thicknesses of up to 0.1um and an image size of 2288 x 1712. Its maximum focusing range is 1.3mm and a speed of 2.4 frames per second, making it an ideal choice for high-precision manufacturing processes. The unit includes a range of applications to help users obtain the most accurate results. These include data analysis functions, which allow users to identify and analyse defects on the wafer or mask. In addition, accuracy setting functions can be used to adapt results to specific customer requirements. The machine also supports multiple measurement modes, such as automatic detection, manual detection, and analysis of automated topology databases. IS 2700SE tool also features a user-friendly graphical user interface (GUI). This allows users to quickly and easily select and configure the asset, as well as manipulating parameters to best fit their requirements. Finally, the model offers flexible networking capabilities, supporting multiple platforms, such as PCNT, TCP/IP, and other networks. All in all, HITACHI IS 2700SE equipment is an ideal solution for semiconductor and microcircuit manufacturers seeking to efficiently measure, detect, and analyze defects on masks and wafers. By using this system, manufacturers can benefit from fewer process delays, improved yield quality, and reduced costs, thereby ensuring the highest manufacturing accuracy and excellence.