Used HITACHI IS 3000SE #293636294 for sale

HITACHI IS 3000SE is a mask and wafer inspection equipment that provides accurate inspection of advanced semiconductor wafers using advanced imaging and analysis technologies. This system incorporates state-of-the-art image acquisition, image processing, and pattern recognition technologies, enabling accurate and reliable inspection of a wide variety of processes, including lithography, reticle patterning, and advanced packaging. The unit is designed with a high throughput capacity, large storage capacity, and high-accuracy image processing capabilities. HITACHI IS-3000SE utilizes HITACHI "go-and-see" approach, which allows for images to be acquired at the highest possible resolutions for the highest accuracy inspections. This machine can acquire high-resolution images of up to 10-micron resolution, capturing both front and back surface details. In addition, the tool utilizes an iterative link auto-alignment technique to achieve precise alignment of multiple elements, resulting in improved accuracy and speed of inspection. IS 3000 SE is equipped with the latest AutoFinder vision asset, providing accurate and reliable inspections for a wide range of defects. This model can detect defects as small as a few nanometers, and is designed to minimize false-positive errors. The AutoFinder equipment also offers a powerful 3D imaging capability and extensive pattern recognition capabilities. The system can be used to detect even the slightest defects and non-conformities, helping ensure the highest-quality products and greatest yields. IS-3000SE also features an integrated wafer mapping and diagnostics unit, allowing for efficient analysis and diagnosis of defects and other non-conformities. This mapping machine helps engineers quickly identify specific defect features and their positions on wafers, providing an efficient path for determining the root causes of issues quickly and accurately. In addition, the tool is equipped with a comprehensive dashboard that monitors and displays real-time inspection results, providing an easily understandable visual representation of performance and results. IS 3000SE is designed for easy installation and integration in both research and manufacturing environments, providing a comprehensive tool for wafer inspection and defect detection. The asset is highly scalable, allowing for easy integration with existing inspection processes and instruments. Furthermore, the model provides comprehensive customer and technical support, enabling customers to get the most out of the equipment.