Used HITACHI IS 3720 #9148226 for sale

HITACHI IS 3720
ID: 9148226
Vintage: 1995
Defect inspection system 1995 vintage.
HITACHI IS 3720 is a versatile Microscopic InspectionT Equipment designed specifically for both mask and wafer inspection applications. It is designed to provide quick, accurate and high-resolution imaging of numerous mask and wafer defects. It features a wide range of options for custom configuration to meet specific project requirements. The system optimizes mask and wafer inspection through high-resolution imaging and automated detection technologies. It features two advanced motorized stages for automated inspection of both flat and curved surfaces. The motorized stages provide extra precision when analyzing masks and wafers. The unit also includes a fully integrated imaging machine. This tool is used to capture high-resolution digital images of the samples in both brightfield and darkfield illumination modes. It consists of a charge-coupled device (CCD) camera, a set of adjustable lenses and an electronic shutter. The asset also provides integrated edge detection and defect analysis capabilities by using a combination of advanced algorithms. The model also includes a flexible masking station with a three-axis motorized stage and a high-powered optical path. This station is used to optimize visibility of masks and wafers when analyzing defects, and it also allows for variable mask alignment in both two- and three-dimensional modes. In addition, the equipment features an advanced user-friendly interface and a comprehensive suite of software. This software can be used to perform a wide range of tasks, including pattern recognition for defect identification, automated pattern recognition for in-depth analysis and microscopic 3D imaging. This system is complemented by an intuitive graphical user interface, which allows for easy customization of the inspection requirements. IS 3720 is a reliable and advanced Microscopic InspectionT Unit that provides excellent results for both mask and wafer inspection requirements. It features a wide range of customizable options and a high-resolution imaging machine to ensure accurate and quick defect analysis. Its intuitive user interface and integrated software suite makes it easy to use, allowing any project to be completed quickly and efficiently with minimal disruption.
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