Used HITACHI LA-3100 #293643617 for sale

HITACHI LA-3100
ID: 293643617
Wafer Size: 8"
Vintage: 2001
Aligner, 8" 2001 vintage.
HITACHI LA-3100 Mask and Wafer Inspection Equipment provides users with a comprehensive inspection system for the visual inspection of wafers and masks. It features a high-resolution color camera for imaging defects, and a 256K pixel CCD based imaging chip for detecting defects. The unit comes with a 12 bit A/D converter and multiple image-processing algorithms for detecting defects. It offers support for both full and partial inspection, and is able to recognize various types of defects present on a wafer or mask. The user-friendly software on the machine makes it easy to navigate through the different functions and control parameters of the tool. Upon powering the asset up, users are greeted with a 7" self-explaining intuitive monitor which contains features such as slide bars for zoom, focus and other parameters, standard menus for customization, and access to several packages for different types of inspections. The model also features a high-resolution digital image output which ensures excellent data quality. LA-3100 offers advanced image processing capabilities, including defect detection, bright-field/dark-field detection, defect classification, and density analysis. It is also capable of performing multiple inspection modes including full-field, right and left comparison, horizontal search, binarization, and others. Additionally, it includes a filter condition adjustment feature to allow users to adjust settings in order to better detect specific defects. An important aspect of this equipment is its ease of maintenance. The user is provided with easy access to all parts necessary to ensure complete maintenance and repair of the system. The user can also easily transfer unit parameters to other HITACHI systems. Overall, HITACHI LA-3100 Mask and Wafer Inspection Machine is an excellent choice for users who are looking for a reliable and versatile inspection tool. It offers advanced features and functions for detecting, sorting, and analyzing a wide range of wafer and mask defects. The asset also comes with excellent user support, allowing users to receive updates and information quickly and easily.
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