Used HITS HFAI-1000D #293670434 for sale

HITS HFAI-1000D
ID: 293670434
Module inspection systems.
HITS HFAI-1000D Mask & Wafer Inspection equipment is a highly automated, high-accuracy solution for mask and wafer inspection. The system is designed to meet the demanding quality assurance, fault detection, and advanced defect detection needs of modern semiconductor production lines. The unit features a high-precision XYZ stage and advanced light-source technology with advanced strobe, white-light, and UV illumination. Housed within a compact cabinet, HFAI-1000D boasts a simple and intuitive user interface that enables easy navigation and precise control. The quality of images produced is further enhanced by its application of various optical techniques, including auto zoom, from dark field to bright field or oblique, to pinpoint and accurately determine the size and shape of defects. Additionally, the machine features advanced fault detection and defect analysis capabilities with an optional software package that provides an integrated approach to hundreds of defect analysis to generate accurate and reliable inspection results. This integrated approach is designed to significantly enhance the qualification accuracy and reduces the time taken for fault detection and defect analysis. The tool's state-of-the-art design and features sets it apart from other mask and wafer inspection systems. The asset is also fully customizable and comes with various inspection options, depending upon the requirements of the customer. The model is capable of providing on-demand production support along with its integrated configurations, optimized process, and real-time cycle-time measurement. HITS HFAI-1000D is suitable for medium to high-volume production and is designed to provide customers with maximum flexibility. Furthermore, HFAI-1000D also includes advanced hardware features such as a fully integrated design, automatic faucet approach, and high speed image-based position determination. Its advanced software capabilities enable the collection of large amounts of surface data and fast real-time defect analysis on large datasets. The equipment also comes with advanced image capabilities such as automatic defect recognition and classification to support high-speed visual inspection. Overall, HITS HFAI-1000D Mask & Wafer Inspection system is an advanced solution for semiconductor manufacturers who need reliable and efficient performance.
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