Used HOLOGENIX NGS 3500 #9137097 for sale

ID: 9137097
Advanced dimensional metrology and defect detection system, 8" Motorized stage with 8"x8" XY travel Motorized Z travel Brightfield and darkfield inspection (5-100) defects/measurements per second typical 200mm/s staging speed Software controlled coaxial and backlight Maximum stage load capacity 50lbs Granite base and Z column Closed loop linear stages with position feedback 0.05u resolution linear glass encoder Software: RMS Vision Systems with color graphics, image archiving, and offline review of defects Nikon microscope with motorized objective rotation Tilting ultrawide trinocular viewing head with 10x eyepieces Hitachi CCTV, Windows XP.
HOLOGENIX NGS 3500 is a mask and wafer inspection equipment designed to detect potential defects and enhance quality control. Its primary function is to facilitate the quality assurance of semiconductor fabrication processes. The system leverages advanced optics to improve the accuracy and speed of detection, allowing quality assurance teams to promptly identify potential flaws in process design or production execution. NGS 3500 utilizes a stabilized Beam Splitter and digital zoom lens to provide detailed, high-quality imaging. An objective lens is used to magnify microscopic defects in the patterning materials, and the unit can provide an adjustable range of magnifications from 150X to 500X. A built-in lighting machine illuminates the sample in many different angles, enabling defect detection under complex lighting conditions. The tool's real-time 3D imaging is precisely constructed by combining a series of images taken at different depths to create a 3-dimensional image. This product eliminates the need for users to manually interpolate multiple images. As a result, inspection times can be significantly reduced, and the asset can detect defects at both the macroscopic and microscopic levels. HOLOGENIX NGS 3500 features a user-friendly operating interface, eliminating the need for lengthy training sessions or manual intervention on the part of the operator. It combines image acquisition and analysis capabilities in a single model, allowing users to quickly process large volumes of data. Additionally, it provides alerting functions to detect trends and changes in mask and wafer surface conditions. NGS 3500 is a very reliable mask and wafer inspection equipment, as it not only detects defects but also enhances quality control. Thanks to its integrated features, the system is capable of reducing inspection time and boosting process efficiency in the semiconductor industry.
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