Used HORIBA / JOBIN YVON PD 2000 #9238477 for sale

HORIBA / JOBIN YVON PD 2000 is a premium mask and wafer inspection equipment, designed to analyze a wide range of samples for defects, irregularities, and other errors. It utilizes a powerful 4x coupled photodiode array dedicated to both signal measurement and dynamic auto-calibration, with a pixel size of 5 μm and a field of view of 10 μm. This allows for maximum defect resolution and detection capability. The system's sophisticated imaging capabilities enable the accurate inspection of wafer features such as contact vias, SOI-vias, and substrate features. HORIBA PD 2000 utilizes a unique beam cleaning unit to maintain the highest levels of reflectance measurement accuracy. This eliminates the need for sample and image preparation, resulting in easier and more efficient operation. The machine also provides real-time feedback on defect scans, enabling the user to quickly identify and fix errors in the images. It has a built-in pattern analysis engine for understanding the fine details of defects and irregularities. Additionally, the tool is equipped with a high-speed HD scan asset, enabling quick and accurate inspections of even the most complex samples. JOBIN YVON PD 2000 offers reliable defect detection and excellent measurement accuracy for a broad range of applications. Its advanced features make it the ideal solution for mask and wafer inspection, allowing users to detect and analyze defects with maximum efficiency. Its highly automated model also makes it easy to use and navigate, further increasing efficiency in mask and wafer inspection. With PD 2000, users can be assured of maximum accuracy and reliability in their mask and wafer inspection tasks.