Used HORIBA PR-PD2 #293747971 for sale

HORIBA PR-PD2 is a mask and wafer inspection equipment that provides reliable quality control and defect analysis of advanced semiconductor devices. The system uses a combination of brightfield and darkfield optics to image masks and wafers at up to 1.9µm resolution, yielding up to 94% defect detection rate and compatibility with a wide range of masks, wafers, and substrates. Both the darkfield and brightfield systems utilize high-end optics and an efficient daylight lamp to provide precise and accurate images. HORIBA PR-PD 2 features automated defect detection unit that quickly detects various types and sizes of defects. A variety of analytic tools and feature sets are available, including particle analysis, wafer map inspection, and geometrical pattern matching. With the particle analysis feature set, PR-PD2 can detect particles in wafers and masks from 4, 5, and 6 microns in size. The wafer map inspection feature allows for automated analysis of wafer maps, allowing for the detection of incomplete patterns or disturbances caused by dark or bright particles. Lastly, the geometrical pattern matching feature enables automated pattern matching, eliminating the need for manual review and improving accuracy. PR-PD 2 comes with several different interfaces, such as serial ports, network ports, and a graphical user interface, allowing for easy integration into existing inspection processes. In addition, the machine can be configured to run on dedicated or shared servers, depending on the inspection settings. The tool software can be installed on any operating asset and controlled from a PC for easy operation and data sharing. HORIBA PR-PD2 also comes with powerful remote control options, allowing users to control the model from any PC or laptop with an internet connection. HORIBA PR-PD 2 has been certified compliant with a variety of industry standards, including SEMI, JEDEC, and JIS. The equipment is designed and built to exacting standards, guaranteeing reliability and accuracy in inspection and quality control processes. Overall, PR-PD2 is an advanced and reliable mask and wafer inspection system that provides excellent defect detection rate, compatibility with a variety of masks, wafers, and substrates, and automated defect detection with a range of feature sets and analytic tools. The unit can be easily integrated into existing processes and controlled from any PC or laptop with an internet connection, making it an ideal choice for semiconductor manufacturers looking to ensure quality in their products.