Used INSPECTECH ITWT 6020 #9266250 for sale

INSPECTECH ITWT 6020 is an automated mask and wafer inspection equipment designed for semiconductor applications. The system uses advanced optics, digital image processing, and probing techniques to rapidly and accurately analyze microscopically resolved images of the inspected wafer surface. The unit features an optical microscope with an integrated dual-tilt plate, high-resolution imaging sensors, and probing tools. This allows for detailed inspection of the target surface features. The dual tilt plate allows for maximum resolution when imaging at an angle, granting excellent angular resolution and account for the curvature or tilt of the wafer surface. Coupled with the high-resolution new-generation sensor technology, ITWT 6020 provides clear imaging of the surface at a 24-bit color depth per pixel for high definition image display and analysis. INSPECTECH ITWT 6020 also utilizes probing tools to extract analytical data from images. The machine is capable of detecting a wide range of surface features, including microscopic defects, contaminants, or other surface anomalies. This includes specialty techniques such as elliptically shaped wafer surface, automatic defect detection, and particle removal. In terms of results, ITWT 6020 tool offers fast and accurate results. Measurements can be made in both a static and dynamic state for accurate imaging, suggesting that the asset can accurately follow changes in wafer structures over time. In conclusion, INSPECTECH ITWT 6020 is an advanced automated mask and wafer inspection model. The equipment offers high resolution imaging and probing, precise surface analysis, and fast and reliable results. This makes it an ideal choice for any semiconductor applications and inspection processes.