Used INTEK PLUS IMAS-2000 #9385508 for sale

INTEK PLUS IMAS-2000 Mask and Wafer Inspection Equipment provides an efficient and cost effective solution for applications such as solar cell inspection, semiconductor device inspection, advanced packaging and flip-chip device inspection. This system is an advanced and reliable imaging unit specifically designed for inspecting both opaque and transparent mask, pellicles and wafers, featuring precise light source performance, fast image acquisition and high resolution imaging for superior defect detection. IMAS-2000 was designed with automation, simplicity and scalability in mind. Automation features such as automated image acquisition, automated image processing, and automated inspection provide an end to end automated solution with minimal user intervention. The machine is modular and scalable, allowing addition or removal of image acquisition and automated inspection modules as needed. INTEK PLUS IMAS-2000's light source consists of both diffuse and direct illumination sources. The diffuse illumination source is configured for brightfield applications providing chromatic independent uniform illuminations. The direct illumination source is configured for darkfield applications and is equipped with shutter control to optimize the contrast levels. The image acquisition tool is configured with an image acquisition sensor with a 2048 x 2048 usable pixel resolution for ultra high resolution imaging. IMAS-2000 also provides high-powered image processing that is capable of detecting subtle defects and software extensions for custom processing capabilities for unique inspection tasks. Automated detection algorithms use algorithms for feature classification and source identification. This helps ensure higher accuracy and consistency in the inspection process. Advanced algorithms such as edge detection, contrast optimization and pattern recognition automaticallyprocess the image to detect defects. Overall, INTEK PLUS IMAS-2000 is a reliable and advanced mask and wafer inspection asset designed to efficiently detect subtle defects in a wide array of applications. Its modular design allows for greater flexibility and customization, while automated functions provide superior accuracy and manual oversight. This model is an excellent solution for solar cell, semiconductor device, advanced packaging and flip-chip device inspection.