Used INTEK PLUS IPIS-LWI1600L #9396010 for sale

INTEK PLUS IPIS-LWI1600L is a mask & wafer inspection equipment designed to provide users with a high resolution and high sensitivity optical inspection. This system is suitable for a wide range of wafer sizes which can be inspected with the automated sample stage unit. This machine utilizes a patented Dual Flying Focus (DFF) laser illumination tool and an advanced laser light source to achieve high resolution inspection capabilities. Additionally, this asset features laser driven optical sensors which ensure accurate and detailed inspections of wafer surfaces. The DFF laser illumination model uses a controlled laser beam to deliver a precise focus of illumination. The user is able to control and adjust the focus to ensure that the lighting is as uniform as possible across the entire surface of the wafer. Additionally, by using a combination of two laser beams, the equipment can enable an accurate inspection of high and low reflectivity areas with assurance of a high-resolution image. IPIS-LWI1600L system also features an advanced laser light source (ALLS). This feature helps to improve the throughput by providing a structured light environment. An advanced algorithm enables the algorithm to keep the light in an optimal state, regardless of the wafer size and shape. The ALLS feature also allows the user to control the exposure time and laser power, ensuring maximum efficiency in the inspection process. The unit is designed to provide a high contrast, high resolution image. All images are extracted from the camera and saved in a digital format for archiving. The individually captured components are then combined together to generate an image with true colormapping. This feature allows the user to accurately identify any defects. INTEK PLUS IPIS-LWI1600L machine is suitable for both industrial and research applications. Finally, the tool is designed for stability and reliability. An embedded asset controller ensures that the model is always calibrated and operates at optimum performance. To further enhance the equipment's performance, the inspection process involves both visual and software algorithms, allowing users to better identify any wafer defects. In addition, the software includes a range of inspections, such as surface topography, bond pads, chip parameters, and optical flat measurements. This ensures that IPIS-LWI1600L provides users with an accurate and reliable inspection solution.