Used INTELLEMETRICS LEP300 #9123983 for sale

INTELLEMETRICS LEP300 is a high-performance mask and wafer inspection equipment that utilizes a 4-zone imaging technology to inspect structure-dependent defects on flat panel displays. It is designed to identify subtle defects that may not be detectable by other methods, such as modifications that appear after an iterative patterning process and through the use of notches. The system is capable of capturing image data and identifying defects at sub-pixel level. The main components of LEP300 are high-resolution, broadband vision cameras, light sources, lenses with various segmentation magnifications, optical filters, and a CCD line scan detector. The cameras are capable of producing dynamic images with very high image quality. Special optical filters are used to help the camera to capture the relevant defects on the panel. High-level image enforcement techniques are also employed by the cameras to enhance the image quality. The unit has four different zones with unique inspection capabilities. The MacroZA zone inspects patterned structures for general defects and particles, while the MicroZA zone inspects defect size, shape, spacing, and gap width. The DetZA zone inspects complex defects which can affect optical performance and the SmallZA zone inspects small defects which are usually not visible to the naked eye. All of these zones combine to provide a comprehensive inspection of the panel. INTELLEMETRICS LEP300 is equipped with sophisticated, real-time analysis software that combines various image processing algorithms to detect and measure defects from the image data. The software also allows for quick data transfer between multiple stations and allows for customized data capture speeds. Additionally, the machine's advanced analyzer capabilities enable the detection of structure-dependent defects, as well as minor modifications. Overall, LEP300 is an extremely powerful and efficient mask and wafer inspection tool. Its advanced 4-zone imaging technology helps to detect and measure defects at a sub-pixel level, enabling enhanced defect detection even in complex patterns and modifications. With its integrated image processing algorithms and sophisticated data capture, the asset is perfectly suited for modern, automated manufacturing operations.