Used IRVINE OPTICAL Ultrastation 3B #9239973 for sale

IRVINE OPTICAL Ultrastation 3B is a mask and wafer inspection equipment designed to inspect and verify semiconductor wafers and masks. It is a fully automated, high-speed and high-resolution imaging solution that is capable of inspecting a variety of masks and wafers from semiconductor fabrication processes. The system utilizes advanced image acquisition and processing techniques to detect defects and features on the wafers and masks. IRVINE OPTICAL ULTRASTATION 3 B is designed with a low-profile, ergonomically designed enclosure and features a 6"x6" inspection area. With a dual-head optical unit, it is capable of producing high-precision images, with up to 8-bit dynamic range for defect detection at both high- and low-magnification levels. Ultrastation 3B also features advanced imaging algorithms to detect and identify very small defects on the mask surface, even in the presence of larger nearby structures. In addition, the results from various inspection tasks can be automatically saved and stored in a variety of formats. ULTRASTATION 3 B has several features to ensure accurate inspection of wafer and masks. These include automated image calibration, color recognition, and optical inspection. Automated image calibration compensates for any rotational, horizontal, or vertical misalignments between the sample and the microscope, ensuring accurate defect detection. Color recognition processes simplify and accelerate defect recognition by identifying and highlighting defects on the wafer and mask surfaces through use of color inversion or highlighting. Lastly, optical inspection includes a comprehensive scan and defect detection process to identify any irregularities in the pattern of the wafer or mask surface. IRVINE OPTICAL Ultrastation 3B also utilizes an intuitive interface to make user operation easier and more efficient. All settings and results can be accessed quickly and easily with just a few mouse clicks. The machine also comes with a comprehensive design and process library, allowing users to easily create and store their own custom inspection parameters and sequences. In conclusion, IRVINE OPTICAL ULTRASTATION 3 B is an advanced mask and wafer inspection tool that is capable of producing high-resolution images and automatically detecting and identifying very small defects. The asset is equipped with several features to ensure accurate inspection of wafer and masks, as well as an intuitive user interface to make operation easier and more efficient.