Used J-MAR 010-3180-012 #9208776 for sale

J-MAR 010-3180-012 is a mask and wafer inspection equipment designed to meet the most challenging quality control and quality assurance requirements. This system utilizes multi-sensor detection technology to detect defects on both masks and wafers, including surface topography, metrology, material composition, and electro-optical properties. With its wide range of inspection capabilities, the unit is capable of detecting even the smallest of defects. 010-3180-012 machine features a full range of automated capability, allowing users to quickly make adjustments suitable for their particular implementation environment. The tool includes a high-resolution inspection camera for detecting defects in micro-scale structures. Additionally, the asset offers automated image stitching capabilities to help users to create panoramic views of masks and wafers. The inspectalization software provides users with easy to use tools to set job parameters, as well as the data analysis and reporting tools required for successful quality assurance and control. The inspectalization software also allows users to import existing job data into the model for further analysis. Additionally, the software boasts an extensive library of templates, allowing for time savings and eliminating the need for users to create their own custom settings. In addition to the automated features, J-MAR 010-3180-012 equipment includes a comprehensive set of manual functions, allowing users to fine-tune the system's settings to achieve the most accurate results for their particular application. The unit allows for both on-line and off-line operation, as well as the use of a host PC for monitoring or to archive the inspection results. 010-3180-012 is designed to provide users with the most accurate and reliable inspection results available on the market. With its comprehensive range of features and software, the machine is well suited to a range of different production environments and provides users with an all-in-one mask and wafer inspection tool that meets their most stringent requirements.