Used JUFU GCT-408-40-CP-AR #9384165 for sale

JUFU GCT-408-40-CP-AR is a highly advanced mask and wafer inspection equipment specifically engineered for ultra-precise, automated defect inspection operations. This state-of-the-art system is designed to exceed all industry standards for efficiency and performance. It can inspect circuits with 20-micron lines and spaces up to 40-micron critical dimensions. It also allows users to customize settings to meet exacting inspection needs. GCT-408-40-CP-AR leverages advanced optical detection technologies, supporting high-resolution, 10 nm imaging. Its proprietary algorithms ensure that every circuit is inspected in a precise and robust manner - ensuring no defects are missed. This unit can detect defects with exceptionally high detection sensitivity, revealing the slightest of defects down to sub-pixel sizes. Its superior image processing and light-field correction capabilities enable ultra-high precision. In addition, the machine is also capabable of detecting surface and shape characteristics, providing a comprehensive view of every chip's condition. Multiple illumination directions are also included for enhanced defect coverage. JUFU GCT-408-40-CP-AR can be integrated with a range of cameras, sensors, and software, making it an extremely flexible solution for mask and wafer inspection needs. Tool automation helps to ensure accurate, prompt, and repeatable results. Wafer alignment and registration functions further ensure efficient defect coverage. Combined with its intuitive graphical user interface, these functions make GCT-408-40-CP-AR the ideal choice for automated defect inspection needs. This asset also has a broad range of applications, making it the perfect solution for semiconductor production processes. From automatic excursion/overlap testing to chip identiy inspection, this model can meet the requirements of any production process and help speed time to market. It can also detect a wide range of critical problems, from cracks and delaminations to misalignments and overlay errors. All in all, JUFU GCT-408-40-CP-AR is a top-of-the-line mask and wafer inspection equipment designed for ultra-precise defect detection. Its cutting-edge optics, robust algorithms, and advanced automation functions make it the perfect solution for any automated defect inspection needs, ensuring that defects are quickly and accurately detected without any compromise to quality or detail.