Used JUFU GTH-150-40-1P #9247162 for sale

JUFU GTH-150-40-1P is an automated mask and wafer inspection equipment designed for easy integration into production lines and laboratories. The machine offers a variety of advanced features for reliable defect detection on a large variety of samples. This optical inspection system is designed for both automated mask and wafer inspection and offers high throughput and high accuracy. The unit utilizes alinear scan optical imaging architecture for accurate defect detection and utilizes a powerful image processor to analyze and analyze the image data. The optical machine is capable of detecting small defects as small as 5 μm and up to 1 mm in size. An integrated CCD camera captures images with a resolution of up to 15μm per pixel, providing high-resolution, high-contrast images. The tool also features a powerful analysis software for defect classification and locating. GTH-150-40-1P has an imaging speed of up to 30m/s, providing a high processing speed for multiple inspection tasks. It can perform up to three types of inspections in one sequence and can handle wafers up to 8 inches in size, with up to 1,000 sites per wafer. Additionally, the asset supports multiple wafer sample sizes, from 1 mm to 4 mm in diameter. In addition to detection of defects, JUFU GTH-150-40-1P is capable of performing various metrology measurements. It can measure the radiance and intensities of a sample, as well as features such as the profile, critical dimensions, and linearity of the sample surface. GTH-150-40-1P is a reliable and versatile model, ideal for both production line inspection and laboratory-level analysis. It offers a flexible and user-friendly interface, allowing users to easily operate the equipment and customize their own settings for various inspection tasks. In addition, the system offers comprehensive data analysis and reporting, allowing users to quickly and accurately analyze results and take corrective actions as needed.