Used JUFU Solar-GaAs-40-CP-AR #9384155 for sale

JUFU Solar-GaAs-40-CP-AR is a mask and wafer inspection equipment designed to meet the demand for high quality photomask and wafer fabrication. The system is an advanced, automated inspection and defect analysis unit for both production and research applications. It is capable of detecting and characterizing various defects before, during and after the photolithography processes. This machine incorporates automatic defect annotation and automated pass/fail determination with false color images for easy defect screening. Solar-GaAs-40-CP-AR tool is an optical based pattern recognition tool that combines advanced optics and motion control. Its highly accurate inspection process utilizes high-resolution laser and video cameras to enable precise measurement and inspection of patterns with 0.01 micron accuracy. The automated defect analysis asset is designed to measure and identify defects in a variety of photomasks and wafers in the 0.3 - 10 micron range. It can detect common defects on the surface of patterned masks and wafers, including scratches, particulates, pinholes, edge breaks and slice marks. The model is also capable of posing samples, sampling and defect indexing in multiple camera views. This interactive inspection and anomaly identification approach equipped with specialized defect software provides the user with an ideal tool to quickly analyze and identify the types and frequency of defects. Furthermore, JUFU Solar-GaAs-40-CP-AR equipment offers open architecture and user-friendly operator menus for flexible integration into production lines and quick and reliable data exchange with other equipment. Finally, the system includes a color monitor and a graphical user interface for easy review, assessment and analysis of the results. This allows for quick and easy manual inspection and access to statistical reports. In addition, the unit includes a comprehensive library of predefined defect types so that the user can easily store and retrieve defect information. Solar-GaAs-40-CP-AR machine provides the user with an effective and reliable tool for automated mask and wafer inspection and analysis.