Used K-MAC ST 4000 #9206782 for sale

K-MAC ST 4000 is high performance mask and wafer inspection equipment designed for quality control and manufacturing process steps. It can capture full chip and reduce image-analysis time considerably. It is equipped with up to 4 cameras and can accommodate 2 wafers simultaneously for highly efficient inspection and production. ST 4000 has an automated wafer loader system that can set multiple menu-built recipes. It offers a high arrangement density of inspection images and multi-width shorts, multiple types of wafer defects, and other types of automatic aging defects (such as baking and air cleaning) can be identified with the support of open source Intelligence software. K-MAC ST 4000 utilizes a laser-scanning confocal microscopy unit for precise imaging of defect areas. ST 4000 has powerful processing power which enables it to process test data and results much faster than before. It is equipped with an advanced auto-focus machine, which allows users to capture high- precision images with low noise. Combined with the automated wafer loader, this tool significantly reduces cycle time and improves inspection accuracy. The integrated software of K-MAC ST 4000 provides complete traceability control, image analysis, and data storage. The software collects and stores data from inspection and production to provide real-time feedback to the factory line. ST 4000 also comes with a robust visualization software and high-speed imaging processing capabilities for users to access images quickly. K-MAC ST 4000 has an offline program development capability, enabling users to develop new inspections without disrupting production. Overall, ST 4000 is an advanced mask and wafer inspection asset that can capture full chips. It provides powerful processing, automated wafer loading, precise imaging and image analysis capabilities, and integrated software for data storage and feedback. This model offers efficient inspection and production cycle times, improved accuracy, and improved traceability and control over the manufacturing process.