Used K-MAC Ster #293650375 for sale

Manufacturer
K-MAC
Model
Ster
ID: 293650375
Vintage: 2017
Film thickness meter LGD P5 OLED Lighting tester 2017 vintage.
K-MAC Ster is an automated mask and wafer inspection equipment designed to increase throughput and reduce inspection costs for semiconductor fabrication processes. The system uses advanced cameras, algorithms and pattern recognition techniques to conduct comprehensive scans of wafers and masks for any anomalies and defects. The robust and lightweight Ster unit combines a high resolution wafer and mask inspection camera, a reliable high-power illuminator and image processing unit to provide reliable and accurate inspection results. The machine is capable of inspecting either single or multiple masks at the same time and can detect both global and local defects. Additionally, the tool is designed to be highly customizable, allowing users to set up a custom scan in minutes. K-MAC Ster provides multiple analysis modes, ranging from rough defect detection to sub-pixel analysis. By using pattern recognition algorithms and inspection parameters, the asset can locate and identify defects quickly and accurately. Additionally, the model is equipped with a variety of defect definition parameters that allow users to customize scan criteria to match their specific requirements. The improved image quality of Ster also greatly reduces false alarms. False alarms are sound triggers that occur due to incorrect equipment settings or incorrect interpretation of a defect. This leads to costly and extensive rework operations. However, sophisticated image enhancement features like image sharpening, denoising and edge enhancement algorithms reduce false alarms and increase accuracy significantly. To further improve the reliability of the system, K-MAC Ster also performs fast and accurate measurements of the defect sizes and locations, which can be used to track defects over multiple mask and wafer cycles. Additionally, the integrated defect management unit allows users to review, modify and store an unlimited number of inspections and compare results across multiple scans. In addition to providing rapid and accurate defect detection, Ster is designed to simplify the workflow and enhance operator productivity, allowing users to achieve higher yields, lower costs, and improved performance. As a result, K-MAC Ster is the ideal choice for semiconductor fabrication laboratories looking for an automated mask and wafer inspection machine that can deliver high-quality results in a cost effective, highly efficient manner.
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