Used KEM / KOKUSAI VR-120SD #9095788 for sale

KEM / KOKUSAI VR-120SD is a mask and wafer inspection equipment designed to detect surface defects, contamination, and process variations of all kinds. The system is capable of inspecting both shallow trench isolation (STI) and various advanced materials and materials combinations such as SiGe with a wide range of substrates and thicknesses. The unit includes an integrated 2D/3D camera for detailed defect capture and analysis, as well as an Industry 4.0-ready manufacturing process control machine. KEM VR-120SD is powered by the latest, industry leading Furtto D9 inspection algorithms which enables ultra-high-speed image acquisition and the ability to analyze defects with accuracy. It is capable of accurately measuring minuscule defects of a size 10 microns or greater without any false alarm rate. The tool can be configured to scan both STI and aspects of advanced metrology such as resistivity, stress, composition, and more, with maximum accuracy guaranteed. The asset's intuitive UX/UI and user-friendly touchscreen interface provide users with an easy to understand interface that simplifies the inspection process. Additionally, it features a wide range of options for customizing the inspection parameters, ensuring consistent and accurate inspection results. Not only does KOKUSAI VR-120SD provide a high quality image acquisition, but it also offers advanced features including image filtering, contrast adjustment, and defect classification. VR-120SD also offers a variety of additional features such as defect reports, end-of-process data collection, and batch summary reports, as well as data exports for a wide range of formats. Furthermore, the model is designed with an open architecture, enabling efficient integration with other devices in the test and process control environment, improving productivity and shortening cycle times. In conclusion, KEM / KOKUSAI VR-120SD is a powerful, versatile mask and wafer inspection equipment that is capable of detecting a wide range of defects. Not only does this system provide advanced features such as image capture and analysis, but users are able to take advantage of additional features such as batch summary reports, and intuitive UI to simplify inspection processes.