Used KLA / ICOS CI 8250 #293591794 for sale

ID: 293591794
Vintage: 2000
Inspection system 2000 vintage.
KLA / ICOS CI 8250 is an efficient and powerful mask and wafer inspection equipment that has been designed to meet the requirements of semiconductor production lines. The main goal of the system is to provide high performance and accuracy in the detection and prevention of defects in the production of microelectronics. It can detect even the minute defects in the mask and wafer layers allowing for their speedy removal from the production line. KLA CI 8250 unit is equipped with advanced hardware, software, and optics to accurately detect defects at both the wafer and mask levels. Its high-performance optics can detect even the smallest defects, providing superior detection and analysis results. In addition, the machine is capable of scanning high resolution images of the mask and wafer layers with a depth of focus up to 16 microns. These sharp images enable careful analysis of the defects present in the layers and enable their speedy inspection. The tool also features a fail safe feature, which ensures that only defects that are beyond the detection threshold can be identified and corrected. This makes it an important tool for ensuring the quality of the microelectronic devices that leave the production line. Additionally, the asset also supports the automated inspection process, further minimizing the possibility of missed defects and reducing human error. ICOS CI-8250 model can be easily integrated into the existing production lines and requires minimal setup. It is also highly flexible and can be customised to the exact requirements and specifications of the production line, allowing for greater efficiency and accuracy in the detection and correction of defects. Additionally, the equipment comes with a user friendly interface allowing for easy operation and the ability to quickly switch between different modes and inspects different sub-systems. Overall, KLA / ICOS CI-8250 is an efficient and powerful mask and wafer inspection system designed to meet the rigorous needs of the semiconductor industry. The unit's advanced hardware, software, and optics enable accuracy and speed in the detection and removal of even the smallest defects, ensuring only quality products are put into production.
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