Used KLA / ICOS CI 8250 #293602014 for sale

KLA / ICOS CI 8250 Mask and Wafer Inspection Equipment is a comprehensive, high-performance automated inspection solution. Designed for both mask and wafer applications, it uses advanced high-resolution cameras and powered dual-axis motion stages to scan and detect defects in the microelectronic devices. Inspection is a critical factor in the fabrication of semiconductor devices and KLA CI 8250 uses advanced pattern recognition technologies to ensure high accuracy and repeatability. Each device is inspected in a step-by-step process, starting with simply imaging each part and identifying edges and other features before proceeding to the detailed inspection phase. The system features a full suite of features and capabilities to ensure high performance and reliability. The wafer and mask can be simultaneously read and analyzed, and each of the two cameras offers 1.2x and 5x magnifications for maximum accuracy. Focusing can also be adjusted at any point during the process for improved precision. A sophisticated pattern recognition algorithm then runs the inspection process. The unit can detect minute defects, dead sites, and other problems down to 1µm in wafer and 0.14µm in mask applications. ICOS CI-8250 also includes a suite of software tools to improve the process with quality metrics, yield analysis, and other data metrics. These advanced capabilities enable the machine to detect a wide range of defects at sub-micron levels with high accuracy and repeatability. The tool offers both static and dynamic inspection, with the latter allowing for multiple iterations if a defect is detected; this provides powerful verification for quality assurance on a wide range of products. In addition to its advanced inspection capabilities, ICOS CI 8250 also offers automatic recipe creation and secure test data management capabilities. The user interface features a simple, intuitive design, making it easy to set up and utilize the asset. The model meets all relevant safety standards and is compatible with a wide range of semiconductor processes. Overall, CI-8250 Mask and Wafer Inspection Equipment is an advanced automated solution for the accurate and repeatable detection of defects in semiconductor parts. It has a wide range of capabilities including high-resolution cameras, sub-micron detection, and multi-stage inspection processes, coupled with advanced software features for quality assurance and secure test data management.