Used KLA / ICOS CI 8250 #293655196 for sale

KLA / ICOS CI 8250 is a market leading mask and wafer inspection equipment designed with fast integration, versatile configurations and use in non-contact 3D inspection applications. The system includes advanced imaging technology, image-processing algorithms, and outstanding unit capability to correctly handle challenging, complex and minuscule parts and defects. It is ideal for inspecting images obscured due to distortion, varying focus, or surface, reflection effects and light scattering. KLA CI 8250 typically makes use of a static, non-oblique imaging path and a fast, high-frequency scanning machine which ensures a highly accurate and constantly updated 3D image. The tool includes a choice of two or four cameras and three different lenses which allows a wide range of component sizes, height, shape and complexity to be inspected. Additionally, the asset offers deflection correction technology to enable accurate, accurate measurements under irregular environmental conditions over a wide working range. At the core of the model is the ALDS-8050 advanced light detector equipment (ALD-S), designed with advanced noise- and text-reduction technology for reliable image capture. It provides uniform illumination for wafers, masks and other substrates of any size and is capable of capturing defect images with a high degree of clarity and fidelity in both single and multiple passes. The ALD-S also features an integrated auto-calibration system that eliminates manual calibration steps. The software bundled with ICOS CI-8250 is focused on providing a comprehensive, user-friendly inspection unit. It includes 3D vision, non-contact 3D geometrical measurements, scanning systems, powerful image-processing algorithms, defect classification and analysis tools as well as automatic defect review and process control (APC). The machine is user-friendly and easy to program, providing the ability to quickly customize inspection inspections to suit specific wafer, mask and component types. The tool provides detailed job reports and process control graphs which ensure that accurate process statistics and data can be maintained. Overall, KLA CI-8250 is a powerful, efficient and accurate mask and wafer inspection asset designed to suit the demands of today's manufacturing environments. KLA / ICOS CI-8250 is quick to deploy, user-friendly, able to accommodate a variety of component sizes, and offers reliable and detailed defect detection and geometrical measurement. It is the ideal choice for mask and wafer inspection operations.