Used KLA / ICOS CI 8250 #9099090 for sale

KLA / ICOS CI 8250 is an advanced automated wafer and mask inspection equipment designed specifically for integrating into semiconductor fabrication process flows. The system utilizes 200 KV Monte Carlo X-Ray technology and advanced automated defect detection and classification algorithms to provide the most detailed imaging available and to ensure the highest level of wafer and mask quality. The 8250 unit features a robust pattern recognition engine allowing automated detection of defects on both wafer and mask substrates. This allows it to detect even the most complex defects, including voids, marks, and breaks. An embedded custom defect review mode also provides advanced operation and review capabilities for optimal defect detection and classification accuracy. The machine has a large area imaging workspace, allowing up to 20,000 wafer or mask images to be identified in a single scan. The ability to rapidly inspect a large area enables the 8250 to significantly reduce inspection time and provide accurate results quickly. The 8250 is designed to be integrated into the process flows of semiconductor production plants. It includes a fully functional front end interface that is customizable to suit the needs and applications of the factory. It also includes a powerful back-end data storage and retrieval tool helping to ensure high data integrity and security. This asset is reliable and easy to operate, providing repeatable and accurate inspection results and enabling it to be used in a wide variety of production line applications. It offers outstanding results, even when inspecting the most complex wafer and mask patterns and features. By combining speed, accuracy, and flexibility, KLA CI 8250 is setting the standard for mask and wafer inspection.