Used KLA / ICOS CI 8250 #9103714 for sale

KLA / ICOS CI 8250 is a state of the art mask and wafer inspection equipment designed to detect and identify defects in the fabrication of semiconductor and photomask devices. This system couples advanced technologies such as optical microscopy (Kreischer-Duncker optical microscopy) and advanced software algorithms to deliver a comprehensive solution for detecting defects on masks and wafers at a sub-nanometer resolution. KLA CI 8250's optics are placed directly above the workbench, allowing for near-instant detection of even the smallest defects and contaminants. The unit also uses advanced software algorithms to identify and categorize defects on masks and wafers, allowing for more efficient defect tracking and correction. ICOS CI-8250 also incorporates artificial intelligence algorithms to understand the subtle differences between defective and non-defective pieces of lithography equipment. This machine has a powerful image analysis tool that is designed to be easily connected to existing computer networks, allowing for sophisticated analysis of acquired images. In addition, the asset is capable of capturing images of defects in a variety of colors and with a magnifying resolution of up to 1400x. CI-8250 model also includes a variety of advanced diagnostic tools. These tools allow for validation of defect sizes and shapes, and the diagnosis of contaminants and other defects. Additionally, advanced imaging tools such as phase contrast, dark field and bright field imaging are available to further enhance accuracy and usability. CI 8250 also includes an intuitive user interface that is designed for easy deployment and streamlining of the entire inspection process. This user interface allows for quick adjustments of inspection parameters to better suit specific tasks and goals. Additionally, the equipment also includes an analysis analysis software that can generate analytical reports to quickly identify trends and potential areas for improvement. Overall, KLA / ICOS CI-8250 is a comprehensive mask and wafer inspection system designed to deliver accurate and reliable results quickly and efficiently. This unit offers our customers a powerful, yet cost effective solution with a wide range of features designed to streamline and improve the process of inspecting masks and wafers for defects.