Used KLA / ICOS CI 8250 #9111213 for sale

KLA / ICOS CI 8250 is a state-of-the-art mask and wafer inspection equipment designed to meet the needs of the semiconductor industry. This automated tool combines advanced optical and software systems to quickly and accurately detect, classify, and measure potential defects on wafers during the inspection process. KLA CI 8250 uses a high-resolution brightfield optical microscope with a resolution of 5 nanometers, as well as a parallel contact individual-spot pattern recognition system. This enables the unit to capture, classify, and measure a wide variety of defects, including scratches, particle debris, line edge roughness, holes, and partial dislocations. The machine can also detect changes in critical dimensions, allowing for efficient quality control. ICOS CI-8250 also features advanced software capabilities. It includes a suite of software tools to assist in defect analysis, including defect image analysis software (IMAX), defect review software (FOTOS), and scan-to-review software (WAVER). These tools enable users to quickly classify and quantify defects, and to notify process engineers when defects exceed a threshold value. In addition, CI 8250 includes a user-friendly interface, enabling efficient and intuitive operation. It also features advanced robotic automation, allowing for automated sample handling and sorting. Multiple sample holders can be used, including flat wafer sample holders, signal integrity array sample holders, and step-and-repeat sample holders. This allows users to optimize CI-8250 for a variety of inspection and analysis applications. In summary, KLA CI-8250 mask and wafer inspection tool provides powerful optical and software systems to quickly and accurately assess potential defects during the inspection process. This automated tool is designed to meet the needs of the semiconductor industry and features advanced robotic automation, user-friendly interfaces, and a suite of software tools to assist in defect analysis.