Used KLA / ICOS CI 8250 #9113513 for sale

KLA / ICOS CI 8250 is an automated, image-based mask and wafer inspection equipment designed for semiconductor manufacturers. It provides users with a comprehensive solution to ensure both wafer and mask quality. The system features a confocal imaging technology based on a laser interferometer and a robust algorithm that produces sub-micron resolution of pattern defects. The unit includes a number of components to help make wafer and mask inspection more accurate and efficient. It employs a state-of-the-art pattern recognition software, a three dimensional motorized objective lens for precise alignment and focus positioning, a laser interferometer for measuring the reflectivity of the reflected light, and a high-resolution CCD camera for capturing image data. KLA CI 8250 is optimized for high performance and sustained throughput. It is capable of generating two-dimensional images with superior speed and accuracy. Rotation and magnification of the image can be adjusted to match the wafer features of interest and to differentiate defects. The machine can identify both types of defects—open-circuit defects, or breaks in the pattern, and closed-circuit defects, or overlaps between pattern elements. ICOS CI-8250 offers a variety of image manipulation tools such as contrast enhancement, sharpening, and edge detection to improve the quality of the acquired images. The enhanced images can then be used to identify and analyze defects more precisely. By using various analysis techniques such as false color mapping, horizontal profile plotting, and histogram analysis, the tool can accurately measure and report the characteristics of the defects. Overall, KLA CI-8250 is an excellent automated inspection asset for detecting and analyzing defects on both wafer and mask layers. Its advanced image enhancement capabilities and analysis techniques offer an efficient solution for post-processing data and yield information which can be used to reduce product down-time and increase production quality.