Used KLA / ICOS CI 8250 #9124473 for sale

KLA / ICOS CI 8250 is a fully automated, advanced inspection equipment designed for precise mask and wafer inspection applications. It is equipped with advanced optics, high-resolution color imaging, and an automated probing station, which enables it to quickly detect and correct defects. KLA CI 8250 incorporates machine learning technology, enabling it to adjust to changing conditions, minimize false positives and improve throughput without operator intervention. The inspection system is fitted with a multiplexed color imaging unit, featuring four simultaneous high-speed color cameras with a 2048 x 1536 pixel resolution. The integrated blue LED light sources provide a uniform brightness and helps enhance the imaging performance. The imaging machine is capable of detecting a wide range of mask and wafer defects, including particles, scratches, voids, and metal film cracks. The tool also inspects for via and line-edge roughness, allowing it to recognize and correct these types of defects. ICOS CI-8250 features a high-speed probing station, which allows it to capture micro-defects before they go to production. The station is equipped with a dual-axis motorized stage and an HD camera. The imaging asset is able to capture four images of every wafer in one location, and up to eight images in one second. The high-speed scanning process ensures high-quality images and provides the model with accurate defect location information. The inspection equipment is powered by advanced software, allowing it to quickly and accurately detect and correct defects. The software incorporates machine learning algorithms, which enable it to adapt to changes in the optical system or wafer features. The unit uses an algorithm to optimize parameters based on the data collected from previous inspection runs, for better throughput. Additionally, the software allows the operator to easily create customized inspection recipes. To help ensure quality and reduce costs, CI-8250 incorporates a range of built-in quality control features. It has an integrated data analysis capability and intelligent reject algorithm to reduce false-positive rejects. It also has a powerful error-detection machine to help eliminate errors in production. Additionally, the tool's training module provides users with detailed instructions on how to operate the asset and interpret results. KLA CI-8250 is a highly reliable and precise inspection model designed to meet the demanding requirements of demanding mask and wafer inspection applications. The advanced optics, imaging equipment and automated probing station, as well as the machine learning technology and data analysis capabilities, enable it to detect and correct defects quickly and with accuracy. The built-in quality control features further increase the system's efficiency and ensure production output is within specification.