Used KLA / ICOS CI 8250 #9305262 for sale

KLA / ICOS CI 8250 is a powerful mask and wafer inspection equipment, designed for identifying and resolving defects in any type of production process. The system utilizes advanced optical imaging technology to quickly inspect whole processed wafers and for detecting both topography and photomask defects. It is capable of performing 2D and 3D image analysis of wafers, and detecting even the smallest of defects with high accuracy. The unit is equipped with a broadband g-line light source and a high-resolution CCD camera, providing bright images with high contrast. Its integrated image processing software allows for quick, real-time automated defect detection. KLA CI 8250 also features a color touch screen interface, providing a comprehensive and fully automated defect analysis. The machine is also capable of producing both 2D and 3D images of inspected wafers in a range of formats. ICOS CI-8250 supports a range of wafers with sizes that range from 200 mm to 450 mm. It is also capable of handling a range of photomask layouts, with a maximum resolution of 1.2 microns. The tool can also detect various types of defects, including particles, topography, gaps, slits, scratches, resist anomalies, and foreign matter. CI-8250 is capable of delivering fast and accurate defect analysis. Its swift inspection process can help reduce quality costs and improve process yields. The asset comes with a wide range of user-friendly features, making it ideal for even the most challenging of automated inspection applications.