Used KLA / ICOS CI 8450 #9124470 for sale

KLA / ICOS CI 8450 is a mask and wafer inspection equipment designed to detect defects on photomasks and semiconductor wafers at the early production stages. It features high-precision optics and imaging systems and its sophisticated electronics support the detection of a wide range of defects on masks and wafers with extreme accuracy. This enables it to identify the most minute defects with high repeatability. KLA CI 8450 features a state-of-the-art optical imaging system as well as high-speed digital image processing to maximize throughput and production efficiency. It utilizes an innovative quad-channel technology to increase accuracy by reducing measurement errors. The unit is capable of performing inspection on double-sides coatings, which is a common challenge in mask and wafer inspection. ICOS CI 8450's software is capable of capturing and analyzing data from multiple sources. It processes data quickly and accurately to perform defect tracking and reporting that enables comprehensive defect monitoring and management in production. Additionally, advanced algorithms are embedded in the software to support defect detection. The machine also includes an intuitive user interface, which enables easy defect recognition and inspection. The interface also supports advanced features such as side-by-side comparison, 3D visualization, and automatic defect extraction. It is also compatible with a wide range of production data formats to enable efficient data management. Furthermore, CI 8450 is an affordable inspection tool that has been designed to provide an optimum price-performance ratio. It can be tailored to individual customers' requirements, offering maximum flexibility and reliability for fast production launch. In summary, KLA / ICOS CI 8450 is an advanced mask and wafer inspection asset that offers the highest accuracy for detecting defects on photomasks and wafers at the early production stages. Its innovative optical design, fast image processing, advanced algorithms, and user-friendly interface make it an ideal choice for identifying defects quickly and accurately.