Used KLA / ICOS CI 9250 #9103722 for sale

KLA / ICOS CI 9250 is a state-of-the-art mask and wafer inspection equipment that utilizes advanced imaging techniques and analysis software to provide an unbeatable inspection solution to the semiconductor industry. This system combines both hardware and software components to provide fast, accurate, and reliable results that surpass other inspection systems. Hardware-wise, KLA CI 9250 utilizes a patented imaging platform that provides high-resolution images of circuit patterns. This unit also utilizes a laser interferometry technique, called aerial scanning, to collect 3D terrain feature maps which are used to determine the overall deviation in the wafer from nominal dimensions. The inspection and analysis process is then carried out with data collected from these scanning techniques. The machine's software is developed with a rapid algorithm-processing engine that enables it to process data from different locations. This allows ICOS CI 9250 to apply corrective actions and provide optimal raw material utilization and yield. Additionally, the tool's advanced algorithms are capable of recognizing subtle pattern defects and distortion, ensuring the highest quality of product. Furthermore, CI 9250 is capable of inspecting the smallest features and patterns of 10um or less. Its advanced diode array detector has a high sensitivity that is capable of choosing different signals for inspection. This improves its overall accuracy and enables it to detect any defect that may be present. Overall, KLA / ICOS CI 9250 is a revolutionary mask and wafer inspection asset that combines advanced hardware and software components to provide the best possible inspection solutions to customers. With its combination of hardware and software features, the model is capable of producing accurate, high-quality results and ensuring optimal raw material utilization and yield.