Used KLA / ICOS CI 9450 #293800808 for sale

KLA / ICOS CI 9450 is a high-speed mask and wafer inspection equipment that uses leading-edge imaging technology to provide industry leading performance and accuracy for wafer and mask defect inspections. KLA CI 9450 system employs an advanced transmissive imaging unit, which uses a high dynamic range cameras combined with advanced illumination sources to capture extremely detailed images with high contrast, regardless of the size and complexity. The machine is also capable of detecting near-infrared and visible light emitting diodes defects. ICOS CI-9450 features advanced Statistical Process Control (SPC) capabilities, allowing for precise control over inspection criteria, as well as automated defect analysis and classification. It also allows for precise control over overlay criteria, with the ability to automatically detect and reject outliers. The tool integrates with the IC-TRACKER™ defect tracking software, providing an integrated defect tracking process. This feature has been tested on various mask patterns to ensure its accuracy and reliability. KLA / ICOS CI-9450 also offers high levels of automation throughout the inspection process. It automatically controls wafer and photo-mask stage positioning and focus, and performs automated defect classification and grading. Additionally, it offers an automated die-to-die comparison mode, allowing for verification of multiple mask patterns in a single run. In addition to its automated features, CI 9450 includes other features to enhance its functionality. These features include adjustable defect sensitivity settings, adjustable defect classification criteria, alerting parameters in case of localized image variation or die-to-die discrepancy, and an onboard library of inspection templates. Overall, KLA CI-9450 is a world-class mask and wafer inspection asset that provides the industry leading performance and accuracy for wafer and mask defect inspections. Its advanced imaging technology, automation features, and Statistical Process Control capabilities make it a powerful and reliable tool in any fault analysis environment.