Used KLA / ICOS CI 9450 #9159855 for sale

KLA / ICOS CI 9450 is a state-of-the-art mask and wafer inspection equipment used in the semiconductor, display, and microelectromechanical system (MEMS) industries. It provides high-resolution imaging capabilities, automated defect detection, comparison between test sites and cataloged libraries, and metrology capabilities. This unit offers a wide range of inspections, including photomasks, SEM (scanning electron microscope), scatterometry, critical dimension, and overlay measurements. Its motorized sorter moves masks and wafers into the microscope for imaging and inspection in a quick, reproducible manner. Its high resolution provides detailed imaging of various features and defects on these substrates. KLA CI 9450 comes equipped with automated defect detection and classification algorithms that can quickly identify visual and non-visual defects. This machine also offers comparison and correlation between pre-fabricated test sites and library sites, allowing for complex defect detection and classification. It can also identify feature-level defects not visible to the naked eye and that would be otherwise undetectable. ICOS CI-9450 also features metrology capabilities, allowing for rapid and accurate measurements of various features on masks and wafers such as line width, line length, and angle measurements. Its automatic focus control mechanism also enables fast, accurate, and repeatable measurements. CI-9450's advanced imaging, automated defect detection, comparison, and metrology capabilities make it a powerful tool for detecting and classifying even the most difficult defects on various types of substrates. These features, combined with its excellent imaging resolution and automated sorter, make it an ideal tool for high-end mask and wafer inspections.