Used KLA / ICOS CI 9450 #9173936 for sale

KLA / ICOS CI 9450 Wafer Inspection Equipment is a high-precision mask and wafer inspection system that is used to detect defects in thin film structures. This unit uses advanced optical, electrical and process tests to analyze semiconductor wafers and masks for defects that may result in poor device performance or potential yield losses. The machine uses sophisticated software suites and image processing techniques to detect and classify defects in real time, providing an automated defect review platform for quality assurance processes. KLA CI 9450 Mask and Wafer Inspection Tool is designed to provide fast, accurate detection of critical defects and material defects on a wide range of substrates. It incorporates a unique combination of optoelectronic, image processing, and film measurement capabilities to ensure comprehensive coverage for defect detection and defect review. The asset is equipped with a dual field-of-view optical platform for wide area inspection and defect classification, and a high-resolution digital camera to capture images of defects and patterns of interest. The advanced imaging algorithms are designed to detect defects at a variety of magnifications and address a wide variety of defect types. ICOS CI-9450 Wafer Inspection Model incorporates a variety of state-of-the-art tools designed to ensure the highest level of quality assurance. This includes a die-centric module for automated inspection and defect classification based on die locations, as well as an advanced 1D algorithm for defect sorting and classification. This equipment provides a host of features to streamline the defect review process, including automated defect review and defect template libraries. Also included is a self-calibration feature that adjusts for process-specific influences. Finally, the software offers an intuitive user interface, enabling operators to quickly access data and review results. KLA CI-9450 Wafer Inspection System is a critical tool for semiconductor wafer and mask manufacturers, providing a comprehensive defect review platform that is both reliable and accurate. This unit offers a wide range of capabilities, including automated defect review, defect identification, defect sorting and classification, and defect template libraries. Additionally, the machine provides robust features including self-calibration for process-specific influences, and an intuitive user interface. With these features, KLA / ICOS CI-9450 Wafer Inspection Tool ensures the highest level of quality assurance in the critical mask and wafer inspection process.