Used KLA / ICOS CI-T120 #293660494 for sale

KLA / ICOS CI-T120 mask and wafer inspection equipment is an advanced metrology solution designed to reduce quality control costs and process time in semiconductor manufacturing. It uses high-resolution imaging and 3D scanning technologies to provide fast, high-precision analysis of mask and wafer devices. With a large field of view and automated wafer mapping, the system offers improved throughput, accuracy, and process yield. KLA CI T120 includes a wide range of interchangeable tools and sensors including an automated focus module, a 3D surface metrology unit, and a high-resolution imaging machine. With the focus module, it can perform fast and precise measurements of critical dimensions (CD), overlay, and vertical structures. A high resolution imaging allows the tool to provide fast wafer mapping and unmatched 3D surface metrology. With its multi-focus, multi-view capabilities, the asset can be configured for a range of wafer sizes and mask formats, and its intuitive user interface makes navigation and control easy. ICOS CI T-120 features automated process recipes and reliable data analysis that reduces setup time and operator error. Automated wafer mapping allows users to quickly and accurately image any part of a device, while automatic analyses and report generation enhance process control. Its integrated defect review and reporting tool helps to improve process reliability and yield. Overall, CI T-120 mask and wafer inspection model is an advanced, high-precision, cost-effective solution for semiconductor manufacturers. With its range of interchangeable tools and sensors, automated processes and collaboration capabilities, it enables users to attain the highest levels of accuracy, throughput and process yield.