Used KLA / ICOS CI-T120 #9101540 for sale
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ID: 9101540
Inspection system
Tray to Tray
BGA 2D/3D inspection
QFP / TSSOP 2D/3D inspection
Currently warehoused.
KLA / ICOS CI-T120 is a high-precision mask and wafer inspection equipment designed for advanced semiconductor manufacturing. It provides advanced mask and wafer defect detection and diagnosis capabilities, making it ideal for use in the fabrication of leading-edge semiconductor devices. KLA CI T120 is based on a modular platform that combines two sensor and illumination systems in one unit. These systems include a CMOS area sensor, a patented IQ² optics solution, and an advanced illumination system. The area sensor has a 24-megapixel resolution, and features a special near-infrared channel for improved contrast and resolution. The IQ² optics unit provides magnification up to 350x, and an extended depth of field for enhanced high-resolution imaging. The illumination machine features both LED and UV light sources, enabling versatile applications with rapid opimization. ICOS CI T-120 also offers comprehensive defect review and detection capabilities. It performs a full range of defect reviews, such as mask defects, pattern defects, pattern copies and film contamination reviews. It also performs automated defect detection, including particle detection and review, and Shape measurement. KLA CI T-120 has a wide dynamic range and high field intensities, providing maximum defect detection and measurement accuracy. ICOS CI T120 is easy to use and provides fast results thanks to its advanced automated defect review mode. It is designed to be integrated into semiconductor manufacturing processes, providing comprehensive inspection solutions for advanced semiconductor processes such as wafer bonding and chip packaging. The tool is also equipped with powerful software tools that enable fast data analysis, image manipulation and reporting. In summary, KLA / ICOS CI T-120 is a high-precision mask and wafer inspection asset designed for the most demanding semiconductor applications. Its comprehensive defect detection and diagnosis capabilities, combined with its ease of use, make it an ideal solution for manufacturing advanced semiconductor devices.
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