Used KLA / ICOS CI-T120 #9162541 for sale

KLA / ICOS CI-T120
ID: 9162541
Vintage: 2008
Inspection system For GW 10H 3D GW Inspection (10) Heads Automatic pitch conversion X1 Input module X2 & X3 Output modules Windows OS: Win Xp Extra single tray sorting bin (X4) Display: LCD display, 17" Gull wing 3D inspection BGA 3D and bottom PVI inspection No 2D QFN / BCC Univ top plate Mark and aPVI option No burr inspection Mark inspection 45mm Lens EXT8 w/o filter: 60 mm, UV filter Barcode scanner USB ZCAL Gloden unit CSP Gloden unit GW Gloden unit GWT12 Gloden unit GW Inspection tool kit BGA Inspection tool kit Z1 10 Head CI-T1x0 Z2 Dual fixed head No ionizer kit SUNX standard Tray orientation kit (nf) Air blower set X1/LIM and MI: Only LIM 2008 vintage.
KLA / ICOS CI-T120 mask & wafer inspection equipment is an imaging tool designed for the production of integrated circuits used in various electronic products. It provides quick, non-destructive scanning and measurement of masks and wafers for impurities and defects. The system integrates advanced metrology, defect review and process control technologies to ensure reliable inspection and accurate results. KLA CI T120 is a high-performance unit with a throughput of up to 3850 wafers per hour. It is designed to detect even the smallest defects down to 0.5microns and smaller. It uses advanced lighting and imaging techniques to provide precise 3D wafer topography measurement. The machine includes a versatile color camera and an inspection head with a continuous 360° rotatable field of view. The tool features Auto Partitioning, which automatically recognizes, identifies and labels each mask/wafer region, thus providing precise alignment, registration and comparison. It supports both misalignment and rotational defect detection enabling classification, review and defect count. It can also assess defect design and size, enabling the detection of common defects such as particles and particles clusters. ICOS CI T-120 includes powerful wafer measurement tools such as Digital Marker Assisted Registration and Auto Focus capabilities to ensure fast and precise Wafer location. It uses advanced LED lighting for high-precision imaging and analysis. Its automated tracking also allows for fast and consistent wafer data collection, analysis and extraction. Additionally, the electronics and software package of the asset enables fast data transfer and communication. Moreover, KLA / ICOS CI T-120 model is designed for easy operation and maintenance with excellent process consistency over a wide range of production batches, ensuring reliable and repeatable results. Its Equipment Monitor feature provides a detailed, real-time diagram of all relevant process parameters, making maintenance and optimization easier. With its user friendly Workbench software, users can customize icons, tools, scripting and action behavior for optimization or process control.
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