Used KLA / ICOS CI-T120 #9190911 for sale

KLA / ICOS CI-T120 is an automated mask and wafer inspection equipment designed to help semiconductor manufacturers maintain high quality standards across their production process. This advanced technology is capable of inspecting the patterns, thicknesses, and other critical dimension characteristics of both projection masks and semiconductor wafers with speed and accuracy. KLA CI T120 system utilizes advanced pattern recognition algorithms to accurately inspect features as small as 0.28 microns. Patented imaging technology allows for the identification of pattern defects in a variety of lighting conditions, including both infrared and visible brightfield illumination, as well as darkfield inspection. It can also accommodate both single-sided and dual-sided wafers. Through the use of innovative anti-aliasing techniques, the unit is capable of edge detection accuracy within 5% of the feature size. ICOS CI T-120 employs a 2k x 4k sensor, allowing for a full inspection rate of up to 16 megapixels per second. The machine has a field of view of 12 inches, enabling high-speed scanning of both small and large masks and wafers. It also offers an inertial motion tool, allowing the operator to manually adjust both the speed and acceleration during inspection. KLA CI-T120 has an intuitive graphical user interface, making it easy to learn and use. It is fully compatible with the SEMI E120 and E134 recommended practices; enabling users to test and certify their masks and wafers according to industry standards. CI T-120 is a reliable, cost-effective solution for semiconductor manufacturers seeking an advanced mask and wafer inspection asset that can help them maintain high quality standards across their production processes. With its advanced imaging capabilities, intuitive user interface, and compatibility with industry standards, CI-T120 is an ideal choice for staying ahead in an increasingly competitive industry.