Used KLA / ICOS CI-T120 #9194219 for sale

KLA / ICOS CI-T120 is a mask and wafer inspection equipment that enables the detection and identification of defects in both photomasks and dielectric wafers. KLA CI T120 is a fully automated system designed to maintain the highest levels of quality and reliability in semiconductor production processes. ICOS CI T-120 incorporates a series of state-of-the-art imaging technologies to provide superior inspection capabilities. It includes a scanning laser beam and high-resolution image capture to generate detailed images of photomasks and wafers. The images are then analyzed by specialized algorithms to detect and identify even the smallest defects on the surfaces of the masks and wafers. The unit is equipped with a sophisticated data management machine that allows for the gathering, processing, and storing of the multi-layered images generated by ICOS CI-T120. This data can then be retrieved and compared with benchmark images to identify any potential defects. KLA CI T-120 also features an intuitive software interface and a built-in pattern recognition tool that makes controlling and analyzing the data easier. KLA CI-T120 can be used to inspect a wide variety of masks and wafers, including those made from silicon, polysilicates, and metals. This ensures that the asset can detect and identify defects on a wide range of materials. The model is capable of inspecting a variety of substrates, including defect-free glass, photomasks, and wafers with heights ranging from 0.1μm to 2μm. In addition to providing superior inspection capabilities, CI T-120 is also highly efficient and reliable. It features a high-speed imaging equipment that allows for the inspection of up to 200 wafers or masks per hour. The system is also designed to minimize downtime, ensuring that the unit is always running at peak performance. Overall, ICOS CI T120 is an impressive mask and wafer inspection machine that successfully combines advanced imaging technologies with user-friendly features to ensure the highest quality and reliability in semiconductor production. Its comprehensive data management tool and intuitive software interface allow for an efficient inspection process and makes it possible to identify and rectify even the smallest defects.