Used KLA / ICOS CI-T120 #9229540 for sale

KLA / ICOS CI-T120 is an automated optical inspection (AOI) equipment designed to perform both mask and wafer inspections. The system is comprised of a compact unit, which houses all the necessary components for the inspection process, such as the light source, optics, and imaging camera. The unit is equipped with a 63x objective lens, allowing for high-resolution imaging up to 1.2um. The chromatic scan technology used in the machine equips it with superior pattern recognition capabilities and high defect detection rate. An auto-focus function is enabled to continually adjust the focus of the lenses, ensuring crisp and accurate image acquisition. The inspection process is accomplished by equalizing the light source irradiation angle from the top and bottom of the object as it passes under the imaging tool. This creates uniform shadowing to enable precise and accurate inspection. A newly configured Z motor compensates for the tilt of the wafer for precise and accurate imaging. The asset also has several built-in algorithms to detect wafer defects, which aids with component traceability and provides the user with comprehensive defect data. The inherent features of KLA CI T120 enable it to provide a defect distortion analysis and 3D imaging, allowing for high yield and accuracy in identifying surface defects. ICOS CI T-120 also has comprehensive connectivity. It offers Ethernet, USB, ethernet, and opto-Isolator I/O capabilities, providing the user interface for systems to allow for remote access and maintenance. This also ensures model integrity as only authorized personnel can access it. It also has a built-in diagnostics function to quickly diagnose and troubleshoot issues remotely to speed up maintenance. KLA CI-T120 is an ideal choice for those looking for an efficient and high-performance mask and wafer inspection equipment. Its sophisticated optics and imaging capabilities, combined with its compact size, make it an ideal choice for any facility. The system's advanced features, such as its auto-focus and defect detection algorithms, make it an essential tool for enhancing quality control and eliminating wastage in production.