Used KLA / ICOS CI-T120 #9247435 for sale

KLA / ICOS CI-T120 slotted inspection equipment is an imaging-based mask and wafer inspection tool. Its high-luminance, optical imaging technology provides users with superior depth of focus and image resolution for IC mask and IC wafer inspection. With advanced features for defect detection, high accuracy, and high throughput, KLA CI T120 is an excellent choice for mask and wafer production-line applications. ICOS CI T-120 utilizes large-field optics and Direct Linear Detectors (DLDs) with 3, 4, or 5 times enhancement, depending on the preset. Its illumination system operates independently of the inspection objective, enabling a wide range of illumination parameters to be set. For samples that require higher resolution, a low-magnification objective is available. KLA / ICOS CI T120's advanced software and hardware enable integration of a range of inspection modes. It can inspect and measure different types of objects including lines, circles, squares, and areas. Isolated and/or connected defects can be automatically detected in the inspection area. Complex defects are detected with the aim of minimizing false alarms, and the unit is capable of analyzing defects from multiple angles. ICOS CI T120 is equipped with a powerful array of filter algorithms, memory systems, and other functions allowing the machine to detect both on-surface and subsurface defects. NV-Series Software (NVSE) is an includes all-in-one service software incorporating digital image in process inspection, post processing, measurement and registration. CI T120 has a sample life expectancy of more than 5 years, and a yield rate of 99.9% or higher. It is designed with a compact structure to make it easily installable. The temperature in the tool is regulated by a dedicated cooling asset, and its variable-direction forced air-cooled exits are designed to ensure an optimal flow of air to dissipate heat without affecting performance. CI T-120 supports a variety of interfaces, including USB, Ethernet, and RS-232. Its high-performance hardware and software, including high-end CPU processors, are designed for maximum flexibility and ease of use. With a simple user interface, users can easily set up, monitor, and program the model. CI-T120 is an effective and reliable mask and wafer inspection equipment that provides users with high-quality images, fast and accurate defect detection, and high throughput. Supported with advanced hardware, software, and features, it is designed to meet any user's high-accuracy and high-throughput requirements for a variety of applications.