Used KLA / ICOS CI-T120 #9256279 for sale

KLA / ICOS CI-T120 Mask and Wafer Inspection Equipment is an advanced imaging solution designed for the inspection of masks and wafers used in advanced semiconductor packaging. The system combines advanced optics and high-sensitivity imaging sensors to provide superior performance and precise defect inspection and classification. KLA CI T120 has an optical unit constructed from a combination of lenses and mirrors. This ensures that very high resolution images can be captured to create detailed inspection results. Additionally, ICOS CI T-120 comes equipped with an advanced sensor array for direct detection of defects. The sensor array works by capturing patterns in the light scattered off the sample surface, allowing it to detect surface imperfections, such as contact holes, trenches, and other features. CI T120 offers excellent accuracy and sensitivity for defects. Its highly accurate pattern detection algorithms can detect defects with submicron resolution and alert the operator in real-time, reducing the time required for manual inspection. Additionally, the machine supports the comparisons of two images taken of the same sample, which can be used to identify changes between the two images and alert the user to potential defects. ICOS CI T120 comes equipped with a state-of-the-art image processing engine. This allows the tool to adjust the mask patterns to any desired orientation or to modify the contrast or brightness of any specific image feature. The asset also has the ability to measure changes in threshold level before and after processing and to apply filters to the image, eliminating unwanted noise to ensure an accurate inspection result. KLA CI T-120 utilizes a digital library for storing images and defect data, allowing the user to easily recall data sets and review results. It can also be accessed remotely via the web or an Ethernet connection, making it a reliable and secure solution for mobile device mask and wafer inspection. Overall, ICOS CI-T120 Mask and Wafer Inspection Model is a powerful and sophisticated imaging solution designed to provide superior image quality and precise defect detection. It is an excellent choice for those looking for a reliable and secure solution for inspecting masks and wafers used in semiconductor packaging.