Used KLA / ICOS CI-T120 #9312491 for sale

KLA / ICOS CI-T120
ID: 9312491
Lead scanners.
KLA / ICOS CI-T120 is an eye in the sky type automated mask and wafer inspection equipment. This high-performance inspection system enables efficient, in-line production and rapid implementation of next-generation die inspection solutions. KLA CI T120 is configured with an automated five-axis x/y/z/rotation/tilting stage which includes its own motion control unit that operat es independently of the vision machine. This motion control tool enables rapid scanning of the semiconductor wafer to enable multiple die inspection, alignment and post inspection quality control. ICOS CI T-120 utilizes its proprietary advanced pattern recognition and its 5-AXIS microscope stage for the inspection of 2D, 3D, and stepped features. KLA CI T-120 is designed to inspect both bare and patterned semiconductor wafers simultaneously for defects. KLA CI-T120 is configurable with UV illumination, and the latest imaging technology Mega-Core image sensors for enhanced imaging results. This asset also supports two full resolution cameras for simultaneous inspections. KLA / ICOS CI T-120 is equipped with advanced ultra-accurate misalignment alignment control for the automated alignment and registration of features and features across pads. This stable model also allows for full flexibility in the registration of repeating patterns. CI-T120 is capable of both inspecting and measuring patterns and defects, including voltage limits, open/shorts, open-source, line width and pattern misalignment. The advanced imaging and proprietary inspection algorithms can also identify a variety of patterns such as contactless, line-fill, line-crossing, voltage limits, lattice and halo structures. The equipment can measure reference registration markers as well as high and low precision of defects, and the field of view can be adjusted for maximum capture and accuracy. ICOS CI T120's flexible software platform makes integration and operation easy, and provides users with a full suite of inspection and reporting tools. Operating system software can be run directly from the embedded multi-processor unit. User control is further streamlined by providing a graphical user interface, as well as access to the touch screen. The software also includes a range of features and control options to customize the unit to specific demands. CI T-120 is designed for 24/7 operation and offers an efficient, error-free solution for automated mask and wafer inspection. The 10-micron maximum motion accuracy, along with its sub-micron z-axis control ensures a clean and accurate pass or fail grade for critical die-level features. This machine is a reliable and easy to use solution for semiconductor manufacturers, and is designed to maximize throughput and quality for successful device production.
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