Used KLA / ICOS CI-T120 #9360771 for sale

KLA / ICOS CI-T120 Mask & Wafer Inspection Equipment is a highly advanced, precision measurement tool designed for use in the semiconductor industry. It is capable of automating the inspection process as well as increasing overall accuracy and efficiency. The system consists of a brightfield laser imaging tool, which is used to measure and inspect a wide range of features on masks and wafers including optical images, line patterns, and flat surfaces. It is equipped with a 10 megapixel, full-color, optical microscope, designed to provide high-resolution images in a variety of settings. The unit also provides a range of advanced features that can be used to customize its performance, such as variable data capturing, programmable reference configurations, along with several quality control and defect detection capabilities. KLA CI T120 machine is designed to maximize efficiency in production. It offers fast, reliable, and accurate measurements, with up to 100-percent data reliability. The tool is equipped with a unique 'multi-axis model' that can measure vertical and lateral features over large areas of the wafer, with a combination of a long-working-distance microscope, and an automated sample stage. Additionally, the asset supports advanced image processing and feature detection algorithms, which allow for determination of defects based on predetermined standards. ICOS CI T-120 model also provides a range of features that allow semiconductor manufacturers to tailor its performance to suit their specific needs. This includes features such as a full-spectrum LED illumination module and an auto-focus stage, which help to facilitate faster and more accurate measurements. It is also equipped with an all-in-one integrated data capture equipment, which can store measurements for up to 8 different configurations. ICOS CI-T120 is a user-friendly system, with straightforward software controls and an intuitive user interface. CI T-120 Mask & Wafer Inspection Unit is an advanced and reliable tool that is designed to help semiconductor manufacturers maximize accuracy, speed, and efficiency. It provides a range of features and capabilities, which can be tailored to suit the specific needs of the user. With its combination of superior imaging capabilities, automated measurements, and advanced defect detection algorithms, the machine offers remarkable precision and reliability and provides a great return on investment.